Broadcom Corporation 16215 Alton Parkway, Irvine, CA 92619-7013 Release Note Broadcom BCM570X Diagnostics for IA-32 and IA-64 04/22/2002 Introduction ============ This file describes the EFI diagnostic tool for Broadcom's BCM570X 10/100/1000 Mbps Ethernet Network Interface Controller. The tool is released as a standard EFI application format. ` 1. b57diag32.efi: BCM570X diagnostic for IA32 EFI platform. 2. b57diag64.efi: BCM570X diagnostic for IA64 EFI platform. This EFI version is based on b57diag.exe of the same version on DOS. For details on history of changes on this diagnostics, please refer to the release.txt from b57diag.exe. Diagnostic Usage ================ 1. Boot into EFI shell. 2. To run the standard diagnostic tests, the file "cpu.bin" must be in the same directory. 3. In IA64 environment, run "b57diag64" to execute all standard diagnostic tests on all BCM570X NICs installed in the system. For addition options, run "b57diag64 -help". In IA32 environment, run "b57diag32". Revision History ================ Version 2.38.1 (04/22/02) 1. Changed to ensure BCM5704-based NICs are not recognized. Version 2.38.0 (04/15/02) 1. Synced up with features with B57DIAG DOS v2.38 Version 2.36.7 (04/10/02) 1. Fixed a problem where blast and txpkt command don't work in engineering mode. Version 2.36.6 (04/05/02) 1. Fixed a problem where Data test fails. Version 2.36.5 (04/04/02) 1. Fixed a problem where MAC address testing fails if the most significant bit of any byte of MAC adress is 1. (CQ 3824) Version 2.36.4 (03/29/02) 1. Fixed a problem where VPD still intermittently fails with BCM5701 NICs. Version 2.36.3 (03/28/02) 1. Fixed a problem where VPD test intermittently fails. Version 2.36.2 (03/27/02) 1. Fixed a problem where physical interrupt test intermittently fails. 2. Fixed a problem where serial EEPROM corruption might occur after some number of iterations. Version 2.36.1 (03/27/02) 1. Fixed VPD read-only test failure. (CQ 3747) 2. Fixed BIST test failure. (CQ 3748) 3. Fixed Expansion ROM test failure. 4. Fixed a problem where system is locked up if Data test fails. Version 2.36.0 (03/26/02) 1. Updated with B57DIAG.EXE for DOS v2.36. 2. Added secondary device (for 5704) NVRAM configaration support Cold reset instead of warm reset before exit. 3. Added pciinit function call before reset if engineering mode was entered be noinit option to prevent reset & flash access fail problem. 4. Fixed NVRAM test failure. 5. Fixed Register Faiure. 6. Added legacy eeprom test for sedvt command. 7. Added dynamic directory support. 8. Fixed some bugs in seeprom cfg which did not save cfg completely. 9. Fixed loopback failure on 5700 for backward compatibility. Version 2.33.0 (03/21/02) 1. Enhanced to access devices with PCI I/O functions associated with its device path. Previous version uses global PCI I/O functions for all devices. 2. Updated with latest features in its counterpart BCM57DIAG.EXE for DOS (v2.33.0). Version 2.18.0 (12/21/01) 1. Revise the version number to be "in sync" with the DOS version. See release.txt of the DOS version for details. Version 2.14.0 (11/06/01) 1. Revise the version number to be "in sync" with the DOS version. 2. Fixed lockup problem when aborting group D test. 3. Uses EfiLoaderData type for the memory pool. Version 1.1.5 (09/21/01) 1. Incorporated all changes up to version 2.13 of the DOS version. 2. Incorporated to use the diag's own little memory manager and added workaround to minimize a memory leak problem which causes group D test to lock up on IA64 (CQ#2287). 3. Added iteration number display on each subtest (e.g. "C2. CPU Test (75)..."). Version 1.1.4 (08/21/01) 1. Removed un-neccessary command line options. Version 1.1.3 (08/16/01) 1. Fixed the intermittent interrupt test failure. 2. Added screen buffer dialog box display. 3. Eliminated ODI driver check (meaningless in EFI). Version 1.1.4 (07/20/01) 1. Resolved CQ2084: fixed B5 test failure on an IA64 with 4 GB of RAM. The top 32 bit of some 64-bit pointer is no longer zero. The fix accomodates this. Version 1.1.1 (07/06/01) 1. Resolved CQ1896: fixed Group A or B test failures on HP IA64. 2. Eliminated the intermittent lockup problem just before running Group D tests. Version 1.1.0 (07/01/01) 1. Renamed it to b57diag.efi. 2. Included IA64 port. 3. Confirmed eeprom programming functionality 4. Tested with BCM5701 A0 cards Version 1.0.0 (06/01/01) 1. First Release. Caveats ======= 1. The serial port communication is not yet supported.Download Driver Pack
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