release.txt Driver File Contents (5702.zip)

                     Release Note for B57DIAG Engineering Diagnostics.
                    ==================================================

Pmodew dos extender has been used to replace dos4gw from version 2.31 and later
to resolve IRQ9 problem. This dos extender is embedded into the diagnostic code
at compile time. Therefore, there won't be a dos extender required at run-time
in the same directory.

Version 2.36g
	1. Added Altima 1011, 1012 support

Version 2.36f
	1. Added T3_PCI_STATE_RETRY_SAME_DMA workaround for 5703/2 A1 and A2 revision

Version 2.36e
	1. Fixed NVRAM failure
	2. Improve phy reset in 5700
	3. Added delay for local control access
	
Version 2.36d
	1. Fixed NVRAM failure
	2. Fixed Auto-polling failure
	3. Fixed failures with 5700 on PCIX

Version 2.36c
	1. Fixed sedump command to support ATMETL flash
                                   
Version 2.36b
	1. Fixed problem with fiber mac loopback
	2. Fixed problem with wol enable on 5700

Version 2.36a
	1. Added LOM EEPROM protection support

Version 2.36
	1. Fixed flash corruption failure.
	2. Fixed indirect register test failure.

Version 2.35
	This version does not support more than 3 devices on a PCIX system. It would result
	in register test A2 failure if 4 or more devices are in the system.

	1. Fixed dma test problem in 5701/pcix.
	2. Fixed a failure on phy interrupt test.
	3. Fixed a failure on Rx Cpu test when loaded from the floppy drive.

Version 2.34
    1. Added secondary device (for 5704) NVRAM configaration support
       Cold reset instead of warm reset before exit
    2. Fixed bustest problem with new DOS extender
    3. Added pciinit function call before reset if engineering mode was 
       entered be noinit option to prevent reset & flash access fail problem.
    4. Fixed NVRAM test failure
    5. Fixed Register Faiure
	6. Added legacy eeprom test for sedvt command
	7. Added dynamic directory support
	8. Fixed some bugs in seeprom cfg which did not save cfg completely.
	9. Fixed loopback failure on 5700 for backward compatibility.

Version 2.33
	1. Added seclock command
	2. Added seinit command
	3. Changed setorture command display
	4. Added -e, -a, -w option to sedvt command

Version 2.32
	1. Added coverage for 5702FE
	2. Handle appropriate link polarity for OEM in PHY loopback test

Version 2.31
	1. Added memory test patterns to memory test
	2. Replaced dos4gw dos extender to pmodew
	3. Added fix to eeprom corruption problem
	4. Fixed IRQ9 hanging problem

Version 2.30
    1. Restored the original prompt :> instead of >
    2. Fixed function/do command parameter passing bug
    3. Fixed version string problem
    4. Extended wait time for firmware after reset
    5. Fixed ROM_test/VPD_test failure
    6. Fixed upgfrm command bug
    7. Added -r option for reset/pcii command to not to halt CPU
	8. Changed sechksum command

Version 2.29
    1. Fixed function printf() parameter bug 
    2. Appended CRC for ASF image programming
    3. Changed sechksum command to display every block checksum in the directory
    4. Support two phase boot code
    5. Changed upgfrm algorithm
    6. Changed secfg to support more configurations
    7. Added user define function
    8. Added parameter passing for user defined function and do commands
	9. Added auto malloc()/DPMI memory detection algorithm

Version 2.28
	1. Fixed problem with firmware response
	2. Fixed problem with eeprom corruption
	3. Fixed MSI test to avoid device string corruption

Version 2.27
    1. Fixed atmel bitbang, seread bug
    2. Fixed -i option for 5703A1
    3. Fixed bug for Gigabit link issue. -- not to force Master all the time. 
    4. Added 'skips' 
    5. Fixed EEPROM size detection bug
    6. Fixed Rainer 1000 link problem
    7. Removed test engineering test B8 from test menu
    8. Fixed error control on test D3
    9. Add loading escape if ASF hangs			 
    10. Add ASF cold and warm boot simulation	 
    11. Add WOL configuation in menu			 
    12. Fix smbout parameter issue
    13. Added Error Control
    14. Removed flshprg command
    15. In manufacturing mode:
        ROM_test (C7) is skipped for 5700/5701 running on PCIX-bus.
        BIST_test (A4) is skipped for 5700/5701.
        MSI_test (D4) is skipped for 5700/5701.
    16. Removed ROM disable test from 5703_A0 device.             

Version 2.26
    1. Changed MBUF water mark for BCM5702/BCM5703.

Version 2.25
    1. Fixed 5703 register 0x4c00 bit 31/30 error (should be no problem with 5703 A1)
    2. Fixed external loop hang problem

Version 2.24 <Pending>
    1. Added support for bridge detection and testing
    2. Changed nictest command. It take "test list" parameter. By defaut, disable EEPROM content check in engineering mode
    3. Separated register test for each board. 
    4. Added pcicfgtest
    5. Added bitbang mode for atmel/stt FLASH device
    6. Added passthru mode for all atmel/att Flash and seeprom
    7. Fixed @ sign (multiple device command parameter bug)
    8. Added ROM disable test
    9. Fixed scratchpad memory test in conjunction with runing firmware bug.

Version 2.23
    1. Updated 5703 register test
    2. Updated DMA test
    3. Added individual register test with back-to-back access
    4. Fixed Interrupt test failing on BCM5700

Version 2.22
    1. Fixed eeprom programming 4k/8k problem 
    2. Fixed 5704 register test
    3. Fixed receive mask error for 5704 XBar mode
    4. Fixed MIItest failure
    5. Fixed 5704 xbar mode, interrupt line bug
    6. Unconditionally enables RX/TX cpu clock at start up 
       (it may be possible disabled by bootcode for WOL)
    7. Added Bist test
    8. Added back-to-back access register test option

Version 2.21    
    1. Moved changes from bcmdiag version 2.6 - version 2.9
    2. Changed t_writemem16, t_writemem8, t_readmem16, t_readmem8 from big endian to little endian
    3. Separated regtest for 5700, 5703, and 5704

Version 2.20
    1. Fixed blast -q option bug
    2. Fixed ASF eeprom programming gap filling bug
            
Version 2.19
    1. Fixed Register test
    2. Restore letency timer/cache line value after reset
    3. Fixed sleep command 
    4. Fixed rs232 echoing 
    5. Fixed register test: regster 690,694 -> 590,594
    6. Fixed Broadcast config.
    7. Changed IKOS flash clock devider to zero
            
Version 2.18
    1. Fixed VPD test
    2. 5703.bin update
    3. flshdiag.bin update
                
Version 2.17
    1. Stablizing tx/rx test
    2. Fixed memory allocation bug
    3. C5/D4 tests still have to be disabled
    4. D2 test has to be disabled due to board design

Version 2.16.2
    1. command clearbit bug fix
    2. added checksum report for bootstrap on sechksum command
    3. Added MSI test. Due to chip bug, this test will not pass on 5703 A0 chips
    4. Fixed setest failure after running romtest.

Version 2.16.1
    1. Memory Leak fix            
            
Version 2.16
    1. Added support commands for engineering mode
    2. Added auto-polling test to mii_test
    3. Added 10MB loopback test
    4. Fixed "Stack Overflow!" bug
    5. Fixed romtest/vpdtest
    6. Added Backword bcmediag compatibility syntax for upgfrm command
    7. Merged board to board test with Fiber Test
    8. Fixed command line option -i to seach for invalid device id. 
        9. Stablized link in TBI/engineering mode.

Version 2.14
    1. Finalize external memory test coding
    2. Added external memory test option
    3. Added external memory code execution test into external mem test
    4. Fixed wol/pxe enabling/disabling problem
    5. Enhanced -x & -w options to accept inputs 0/1 for disabling/enabling

Version 2.13
    1. Correct FCS error statistic read

Version 2.12
    1. Fixed a bug in PXE programming code

Version 2.11
    1. Fixed DMA failure for specific OEM
    2. Fixed failure on an OEM PCIX bridge

Version 2.10
    1. Added detection for specific OEM

Version 2.09
    1. Removed un-neccessary command line options

Version 2.08
    1. Correct Silicon revision

Version 2.07
    1. Fixed external loopback failure in version 2.06
    2. Added command line option to view eeprom binary file
    3. Disable WOL update function

Version 2.06
    1. Fixed TBI mode failures on phy_type problem
    2. Fixed Specific OEM message
    3. Enter OEM manufacture code to handle link polarity in loopback tests

Version 2.05
    1. Fixed DMA on PCIX failure
    2. Take out packet # on loopback tests
    3. Change order of tests per customer request
    4. Fixed external loopback failure
    5. Changed VPD test
    6. Added -all option
    7. Added -noinit option

Version 2.04
    1. Fixed copper mac loopback hang problem
    2. Fixed D3 loopback link problem

Version 2.03
    1. Added Phy type/led mode/voltage source/part revision selectability in eeprom.txt
    2. Added real/customer rev options
    3. Speed up prog. pxe
    4. Mac I/O reset

Version 2.02
    1. Added TBI support

Version 2.01
    1. Added FORCE_PCI and VOLTAGE_SOURCE to EEPROM.TXT file.
    2. Changed secfg command to support FORCE_PCI and VOLTAGE_SOURCE
    3. Added -coe to continue on error

Version 2.00
    1. Fixed IRQ9 problem on specific OEM
    2. Fixed Interrupt test failure reported from QSA
    3. Fixed CPU test problem reported from Systems Engineers

Version 1.29
    1. Skip test on NIC card that has ODI loaded
    2. Fixed loopback hanging problem by adding delay time to ISR 

Version 1.28
    1. Added generic key code for eeprom generation

Version 1.27.1
    1. Fixed a bug in manufacturing mode
    2. Added compile option for specific oem

Version 1.27
    1. Added sramtest command to test external memory in engineering mode
    2. Added dbgmode to set a debug mode flag in engineering mode
    3. Removed xmtest option which is not really needed
    4. Added patch in loopback test to lower expectation on reception in case of chip testing
    5. Modified external memory test routine
    6. Added options debug/nocrc/chip/mac
    7. Modified LoadPatchFirmware routine
    8. Modified testfailed routine to enter engineering mode if fails and debug option entered
    9. Fixed bug in eeprom programming
         
Version 1.26
    1. Checked-in the fix for HP shared 9 interrupt issue (enabled back irq9 interrupt)
    2. Fixed a bug in loopback tests
    3. Fixed IRQ sharing with another device, such as Intel NIC, on memory read problem
        4. Added CRC patch from Engineering for 5701

Version 1.25  (Internal Verion)
    1. Added -debug option, when it fails jumps to debug prompt
    2. Reduced timeout wait time

Version 1.24
    1. Fixed bug in the load_firmware routine
    2. Disabel IRQ9 chaining

Version 1.23
    1. Added support for BCM5701-A0
    2. Fixed interrupt chaining with IRQ9

Version 1.20
    1. Changed to jump into command mode when no card detected with option -b57eng
    2. Revise options -x and -w as following:
                When nothing entered, always disable PXE/WOL
                When -x or -w is entered, always enable PXE/WOL
                When -f is entered, use eeprom.bin's content for PXE/WOL/PXE speed setting
                When -f is entered and -x or -w is also entered, force PXE or WOL to enable 

Version 1.19.3
    1. Changed -f option to use eeprom.bin PXE and WOL setting instead of forcing to disable

Version 1.19.2
    1. Changed software to exit directly to dos when no card was detected. No ESC needed

Version 1.19.1:
    1. Added Altima/5411 support
    2. Added loop command
    3. Added mrloop command
    4. Added option -geneep, -geneepkey
    5. Added option -ver to display current version number
    6. Removed mac_pref.txt input file for mac prefix -> now should use eeprom.txt to update eeprom.bin.
       The eeprom.bin prefix is used if the mac input is less than 12 digit.
    7. Added RJ45 external loopback for 100/1000

Version 1.19:
    1. Add -xmtest option to increase memory test coverage
    2. Reverse some coding on eeprom file dumping that is no long needed
    3. Change eeprom programming counter display from hex to decimal          
    4. Added B7 MBUF memory special test
    5. Put back interrupt chaining except irq9
    6. Increased MAX_DEVICE from 8 to 16. Now it can support up to 16 devices
    7. Fixed bug to restore phy state from isolated mode after test

Version 1.18e:
    1. Fixed EEPROM access hang when loopback connector is connector is connected

Version 1.18:
    1. Fixed IRQ 9 test D1 hang problem. 
    2. Restored LED to LINK3 LEDMODE after phy loopback test.
    3. Added command rm.
    4. Fixed MAC address display bug.
    5. Added Link speed 10 test A1,A2 failure problem with workaround.
    6. Changed -bus option to test specified slot only. This option is invalid if -c option is used.
    7. Fixed intermitent failure/system hang problem when loopback connector is connected

Version 1.17:
    1. Change MAC address reading to accept variable length instead fixing to 7 digits.
    
Version 1.16:
    1. Changed the parameter misspelling "-dmpi" to "-dpmi"
    2. Fixed the EEPROM size 0x204 programming bug due to the structure size define error.
    3. Display not only device number but also bus:dev on error messages
    4. Fixed Test D1, "Cannot Tx Packet" bug.
    5. No sharing on IRQ 9

Version 1.15:
    1. Added command line option -dpmi to use DMPI method memory allocation
    2. Added command line option -bus bb:dd:ff to test against specified bus & device number
    3. Displays device number on error message

Version 1.14:
    1. Fixed PCI-X eeprom access bug.
    2. Invalidate the default xx-xx-xx-00-00-00 mac address. However, it allow user
       to enter mac address as xx-xx-xx-00-00-00. 

Version 1.13:
    1. Fixed Memory Allocation Problem for Dell 8450.
    2. Added PCI-X support
    3. Programmed MAC (in PCI-X mode) to not allow set the Relaxed Ordering Bit in 
       the Requestor Attributes of transactions it initiates that do not require 
       strong write ordering.

Version 1.12:
    The new options -n, -m, and -f now requires -e option to be activated

    1. New Option -n 
        With this option, the program will run in manufacturing loop. 
        It supports power on/off of UUT. This will ignore the option -I, 
        the iteration option.
 
    2. New Option -m
        Prompt user for the MAC address. With this option, user must enter/scan
        the mac address before testing. The program also checks for the file
        "mac_pref.txt" This is a text file should contain six digits of ASCII 
        MAC three-byte-prefix address. Any of the following format is supported:
 
        Example:
            000467
 
            00 04 67
 
            00
            04
            67
 
        If this file exists, user has option to enter/scan 7 digit hex number. 
        The first digit will be ignored and the last 6 digits will be used for 
        the lower part of MAC address. Combine with the prefix, it creates 6 
        byte (12 digit) hex number. 
        If this file does not exist, the whole 12 digit number must be entered
        for the MAC address. When entering MAC address, a space character is 
        allow between each byte. For example, any of the following is valid.
 
        000467010203
        00 04 67 01 02 03
        1010203           (currently, the scanner uses this format)
 
    3. New Option -f
        Program "eeprom.bin" into EEPROM before testing. The file "eeprom.bin" 
        must be there or the program will not run with this option. 
 
        The -m and -f combination will create the following behavior:
 
        a) -f and -m: 
 
        Program will not validate the eeprom content and go ahead to prompt 
        user for the MAC address. It programs MAC address and EEPROM content 
        and then checks the validity of eeprom content at the end of 
        programming.


        Loading EEPROM content from eeprom.bin: passed   -- enter MAC address after pass here
        Programming EEPROM from eeprom.bin....: passed              
        Checking EEPROM content...............: passed
 
        b) -f only
 
        Program will check the validity of eeprom. If it is not valid, 
        it will act as a), -f -m option. If it is good, it saves the MAC 
        address from eeprom, program new eeprom.bin content into EEPROM 
        and then restores the original MAC address. It checks the validity 
        of eeprom content once more at the end of programming. 


        Checking EEPROM content...............: passed
        Loading EEPROM content from eeprom.bin: passed
        Programming EEPROM from eeprom.bin....: passed
        Checking EEPROM content...............: passed
 
        or 
 
        Checking EEPROM content...............: invalid
        Loading EEPROM content from eeprom.bin: passed         -- enter MAC address after pass here
        Programming EEPROM from eeprom.bin....: passed
        Checking EEPROM content...............: passed
 
 
        c) -m only 
 
        Program will check the validity of eeprom. If it is not valid, 
        it will act as a), -f -m option. If it is good, the program will 
        prompt the user for a new MAC address and program the MAC address 
        only. It checks the validity of eeprom content once more at the 
        end of programming. 
 
        Checking EEPROM content...............: passed        -- enter MAC address after pass here
        Programming MAC address...............: passed
        Checking EEPROM content...............: passed
 
        or 
 
        Checking EEPROM content...............: invalid
        Loading EEPROM content from eeprom.bin: passed         -- enter MAC address after pass here
        Programming EEPROM from eeprom.bin....: passed
        Checking EEPROM content...............: passed
 
 
        d) no -m and -f options
 
        Program will check the validity of eeprom. If it is not valid, 
        it will act as a), -f -m option. If it is good, it proceed to 
        normal diagnostics.
 
        Checking EEPROM content...............: passed
 
        or
 
        Checking EEPROM content...............: invalid
        Loading EEPROM content from eeprom.bin: passed         -- enter MAC address after pass here
        Programming EEPROM from eeprom.bin....: passed
        Checking EEPROM content...............: passed

    4. Fixed -x -w option checksum false error report bug

 

Version 1.11:
    1. Added features to secfg command to allow users to program VPD-R and 
       VPD-W information.
    2. Removed all debugging information to reduce file size.
    3. Manufacture test includes EEPROM content testing. If manufacture checkusm
       is bad, it prompts user to enter MAC address. If the checksum it good, it 
       will save the mac address before programming eeprom.bin if user choose to
       do so. 
    4. Changed Internal MAC loopback test from 100 to 200 packets. 
       Changed Phy loopback test from 100 to 2000 packets.
       Changed RJ45 loopback test from 100 to 2000 packets.
    5. Removed pattern and altenate pattern test from memory test to increase speed.
    6. Removed VPD test to increase speed. Since both eeprom test and vpd test
       exercise hardware eeprom. There is no needs for extensive test for both.

Version 1.10:
    1. Removed bit 13 register 11 read only bit test for MII test
       The MDI Crossover state bit changes internally when there is no cable
       connected. It is not reliable to be tested as read only bit and it is not
       an error. 

    2. Suppressed the error dialog when run without -p option

Version 1.09:
    1. Moved over bcmediag.exe version 1.24 - 1.30 changes.
       
      bcmediag.exe Version 1.30:
        a. Added bustest to test out PCI bus in the worst case scenarios.  The goal is
           to have every data/control lines toggled.
           Usage : bustest -a=address -n=iteration -l=min_len -h=max_len
                   -i=transaction -s=start_case -e=end_case
                   -a : NIC address to DMA data to.
                   -l : Minimum length (default = 256).
                   -h : Maximum length (default = 1024).
                   -n : iteration (default = 1)
                   -i : Number of transactions per pattern (default = 10)
                   -s : Start of test case (default = 0)
                   -e : End of test case (default = 259)

          There are total 260 test cases (258 unique tests cases) which 
          are described as follows:

        Test case#                    Pattern 
        ==========       ==================================
           0             ffffffff ffffffff 00000000 00000000
           1             ffffffff fffffffe 00000000 00000000
           2             ffffffff fffffffd 00000000 00000000
           .                    .
           .                    .
           .                    .
           64            7fffffff ffffffff 00000000 00000000
           65            00000000 00000000 ffffffff ffffffff
           66            00000000 00000000 ffffffff fffffffe
           67            00000000 00000000 ffffffff fffffffd
            .                   .
            .                   .
            .                   .
           129           00000000 00000000 7fffffff ffffffff
           130           00000000 00000000 ffffffff ffffffff (repeat)
           131           00000000 00000001 ffffffff ffffffff
           132           00000000 00000002 ffffffff ffffffff
            .                   . 
            .                   .
            .                   .
           194           80000000 00000000 ffffffff ffffffff
           195           ffffffff ffffffff 00000000 00000000 (repeat)
           196           ffffffff ffffffff 00000000 00000001
           197           ffffffff ffffffff 00000000 00000002
            .                   .
            .                   .
            .                   .
           259           ffffffff ffffffff 80000000 00000000

             If you run bustest command without any parameters, it will perform 
             DMA testing on all 260 patterns with 10 iterations per pattern and
             different data length in each iteration.  First eight bytes of data
             are used to store the following info for debug:

             byte 0-4 : length
             byte 5-6 : iteration#
             byte 6-7 : test case#

        b. Added PCI-X support and work-around for B1 silicon.  This version
           diagnostics detects if the NIC is in PCI-X slot.  If yes, work-around
           is implemented.  However, user still can overwrite this by issuing 
           debug -c=5 to toggle PCI-X work-around before loading driver.

      bcmediag.exe Version 1.28:
        a. Made minor changes to support B1 silicon due to changes in ASIC revision
           format.

      bcmediag.exe 1.27:
        a. Added new commands to utilize BCM5500 built-in BERT features. Three 
           new commands are added:
            * lbertram: load BERT pattern into BERT TX&RX RAM, and enable BERT.
            * dbertram: Dump BERT TX& RX RAM.
            * bertstats: Display BERT statistics.

      bcmediag.exe Version 1.26
        a. Changed initialization of BCM5500.

      bcmediag.exe version 1.25
        a. Added support for Serdes PHY (BCM5500) and TBI interface.
        b. Added code to allow transmit jumbo frames up to 9022 bytes/packet
           with txpkt command. (Note that you have to delete diagcfg.bin
           before run bcmediag if you want to transmit jumbo frames over
           4Kbyte/packet).
        c. Added PCI-X support and work-around for B0 silicon.  This version
           diagnostics detects if the NIC is in PCI-X slot.  If yes, work-around
           is implemented.  However, user still can overwrite this by issuing 
           debug -c=5 to toggle PCI-X work-around before loading driver.

      bcmediag.exe version 1.24:
        a. Enhanced txpkt/txcfg command to allow users to:
           * Transmit random IP headers including IP options.
           * Transmit random TCP headers including TCP options.
           * Transmit random data payload.
        b. Added code to check IP/TCP/UDP checksums of incoming packets.

    2. Changed command user interface routines. This changes some of command syntax
    3. Fixed WOL spelling
    4. Change command help output.
    5. Added -p option to print on Error
    6. Display error on Red dialog with option to continue or print
     

Version 1.08:
    1. Put delay in test C3 to avoid low priority DMA test error
    2. Replaced original nictest with manufacturing tests
    3. Fixed domument error code error, error code number 28 and greater was
       shifted by 1. 
    4. Added error code 39,40,41,42
    5. Changed test B5. External RAM test to detect the existance of external 
       RAM first for testing

Version 1.07:
    1. Changed ESC to CTL-C as break key
    2. Changed -t and -T option to allow multiple group specification in one option
    3. Changed test D3 to be disabled by default
    4. Added "Unit Under Test: NIC" line at error output
    5. Unload all drivers upon exit

Version 1.06:
    Added -I option for iteration

Version 1.05:
    1. Rewrote all tests to comply to OEM's manufacture error message requirement
        2. Added -t to disable tests and -T to enable tests
                 format: -t <gnnn> where g is the group letter can be A,B,C, or D
                                                 n is the subtest number it should be '1' to '9'

             example: -t A345 -t C13 -T b12   this will disable test A3,A4,A5,C1,C3 
                                                          and enable test B1,B2.

Version 1.04:
    1. Added -m option to disable RJ45Loopback Test

Version 1.03:
    1. Fixed multiple card interrupt problem. 
           Original call had only one variable to save original interrupt
           vector. If multiple cards use different interrupts, some origianal 
           interrupt vector get lost. This will cause problem after exiting program.
           Code is changed to support shared interrupt as well.

    2. Comment out some unreachable code in order to reduce code size.

Version 1.02:
    1. Added changes due to changes in boot code firmware 0.6.  Before issuing
       CHIP reset (or GRC reset), it writes a siginature to SRAM so that 
       firmware wouldn't perform code boot initialization such as PHY
       H/W reset, PXE loading, etc...

    2. Added new command to upgrade boot code firmware without corrupting 
       manufacturing information.  
           upgfrm -b -p -f=<filename>
               -b: upgrade boot code. 
               -p: upgrade PXE.
               -f: input filename.

    3. Changed command line option -m to -e to run engineering mode

    4. Added command line -i for force_program_device_id option
           restored option -a for setting base memory address

        5. Added 5701 support

    6. Added multiple card support

        This version change is the same as bcmediag.exe v1.20 changes to v1.23.

Version 1.01:
    1. Fixed and enabled RJ45 loopback test
    The test requires to reset the system each time
    replace the adapter.

Version 1.00:
    1. Fixed Phy Loopback test
        2. Fixed ASIC version number display
        3. Disabled RJ45 loopback test

The program disables PXE and WOL by default.
To enable PXE: type b57diag -x
To enable WOL: type b57diag -w

Download Driver Pack

How To Update Drivers Manually

After your driver has been downloaded, follow these simple steps to install it.

  • Expand the archive file (if the download file is in zip or rar format).

  • If the expanded file has an .exe extension, double click it and follow the installation instructions.

  • Otherwise, open Device Manager by right-clicking the Start menu and selecting Device Manager.

  • Find the device and model you want to update in the device list.

  • Double-click on it to open the Properties dialog box.

  • From the Properties dialog box, select the Driver tab.

  • Click the Update Driver button, then follow the instructions.

Very important: You must reboot your system to ensure that any driver updates have taken effect.

For more help, visit our Driver Support section for step-by-step videos on how to install drivers for every file type.

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